Pattern Recognition Imaging for AFM Measurements

Mario D’Acunto; Ovidio Salvetti

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Paper

Pattern Recognition Imaging for AFM Measurements

In Proceedings of the Third International Workshop on Image Mining Theory and Applications - Volume 0VISIGRAPP, 68-77, 2010 , Angers, France

Authors: Mario D’Acunto and Ovidio Salvetti

Affiliation: Instituto di Scienze e Tecnologia dell’Informazione, ISTI-CNR, Italy

Abstract: The focus of this paper is on an algorithm for distortion corrections for atomic force microscope (AFM) recorded images. AFM is a fundamental tool for the investigation of a wide range of mechanical properties due to the contact interaction between the AFM tip and the sample surface. When a sequence to AFM images correspondent to the same area are recorded, it is common to observe convolution of thermal drift with surface modifications due to the AFM tip stresses. The surface modifications are material properties and add knowledge to the response of the materials on nanoscale. As a consequence, a suitable de-convolution of the thermal drifts on the recorded images need to be developed. In this paper, we present a method for correcting thermal drifts where the original images are corrected using a low-order polynomial mapping function. The precision achieved and the fast computation time required make our method particularly useful for image analysis in a wide range of applications.

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Paper citation in several formats:

D’Acunto, M. and Salvetti, O. (2010). Pattern Recognition Imaging for AFM Measurements. In Proceedings of the Third International Workshop on Image Mining Theory and Applications (VISIGRAPP 2010) - IMTA; ISBN 978-989-674-030-6, SciTePress, pages 68-77. DOI: 10.5220/0002962600680077

@conference{imta10,
author={Mario D’Acunto. and Ovidio Salvetti.},
title={Pattern Recognition Imaging for AFM Measurements},
booktitle={Proceedings of the Third International Workshop on Image Mining Theory and Applications (VISIGRAPP 2010) - IMTA},
year={2010},
pages={68-77},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0002962600680077},
isbn={978-989-674-030-6},
}

TY - CONF

JO - Proceedings of the Third International Workshop on Image Mining Theory and Applications (VISIGRAPP 2010) - IMTA
TI - Pattern Recognition Imaging for AFM Measurements
SN - 978-989-674-030-6
AU - D’Acunto, M.
AU - Salvetti, O.
PY - 2010
SP - 68
EP - 77
DO - 10.5220/0002962600680077
PB - SciTePress