ONE-SHOT 3D SURFACE RECONSTRUCTION FROM INSTANTANEOUS FREQUENCIES - Solutions to Ambiguity Problems

F. van der Heijden, L. J. Spreeuwers, A. C. Nijmeijer

2009

Abstract

Phase-measuring profilometry is a well known technique for 3D surface reconstruction based on a sinusoidal pattern that is projected on a scene. If the surface is partly occluded by, for instance, other objects, then the depth shows abrupt transitions at the edges of these occlusions. This causes ambiguities in the phase and, consequently, also in the reconstruction. This paper introduces a reconstruction method that is based on the instantaneous frequency instead of phase. Using these instantaneous frequencies we present a method to recover from ambiguities caused by occlusion. The recovery works under the condition that some surface patches can be found that are planar. This ability is demonstrated in a simple example.

References

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Paper Citation


in Harvard Style

van der Heijden F., Spreeuwers L. and Nijmeijer A. (2009). ONE-SHOT 3D SURFACE RECONSTRUCTION FROM INSTANTANEOUS FREQUENCIES - Solutions to Ambiguity Problems . In Proceedings of the Fourth International Conference on Computer Vision Theory and Applications - Volume 2: VISAPP, (VISIGRAPP 2009) ISBN 978-989-8111-69-2, pages 423-428. DOI: 10.5220/0001773504230428


in Bibtex Style

@conference{visapp09,
author={F. van der Heijden and L. J. Spreeuwers and A. C. Nijmeijer},
title={ONE-SHOT 3D SURFACE RECONSTRUCTION FROM INSTANTANEOUS FREQUENCIES - Solutions to Ambiguity Problems},
booktitle={Proceedings of the Fourth International Conference on Computer Vision Theory and Applications - Volume 2: VISAPP, (VISIGRAPP 2009)},
year={2009},
pages={423-428},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0001773504230428},
isbn={978-989-8111-69-2},
}


in EndNote Style

TY - CONF
JO - Proceedings of the Fourth International Conference on Computer Vision Theory and Applications - Volume 2: VISAPP, (VISIGRAPP 2009)
TI - ONE-SHOT 3D SURFACE RECONSTRUCTION FROM INSTANTANEOUS FREQUENCIES - Solutions to Ambiguity Problems
SN - 978-989-8111-69-2
AU - van der Heijden F.
AU - Spreeuwers L.
AU - Nijmeijer A.
PY - 2009
SP - 423
EP - 428
DO - 10.5220/0001773504230428