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Authors: Sébastien Gebus and Kauko Leiviskä

Affiliation: University of Oulu, Finland

Keyword(s): Decision support system, knowledge acquisition, quality, optimization, traceability, feedback.

Related Ontology Subjects/Areas/Topics: Artificial Intelligence ; Artificial Intelligence and Decision Support Systems ; Biomedical Engineering ; Decision Support Systems ; Distributed Control Systems ; Enterprise Information Systems ; Expert Systems ; Health Information Systems ; Informatics in Control, Automation and Robotics ; Intelligent Control Systems and Optimization ; Intelligent Fault Detection and Identification ; Knowledge Engineering and Ontology Development ; Knowledge-Based Systems ; Knowledge-Based Systems Applications ; Symbolic Systems

Abstract: Real-time process control and production optimization are extremely challenging areas. Traditional approaches often lack in robustness or reliability when dealing with incomplete, inaccurate, or simply irrelevant data. This is a major problem when building decision support systems especially in electronics manufacturing, where blind feature extraction and data mining methods on large databases are common. Performance of these methods can be drastically increased when combined with knowledge or expertise of the process. This paper describes how defect-related knowledge on an electronic assembly line can be integrated in the decision making process at an operational and organizational level. It focuses in particular on the acquisition of shallow knowledge concerning everyday human interventions on the production lines, as well as on the conceptualization and factory wide sharing of the resulting defect information. Software with dedicated interfaces has been developed for that purpos e. Semi-automatic knowledge acquisition from the production floor and generation of comprehensive reports for the quality department resulted in an improvement of the usability, usage, and usefulness of the decision support system. (More)

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Paper citation in several formats:
Gebus, S. and Leiviskä, K. (2007). DEFECT-RELATED KNOWLEDGE ACQUISITION FOR DECISION SUPPORT SYSTEMS IN ELECTRONICS ASSEMBLY. In Proceedings of the Fourth International Conference on Informatics in Control, Automation and Robotics - Volume 1: ICINCO; ISBN 978-972-8865-82-5; ISSN 2184-2809, SciTePress, pages 270-275. DOI: 10.5220/0001615102700275

@conference{icinco07,
author={Sébastien Gebus. and Kauko Leiviskä.},
title={DEFECT-RELATED KNOWLEDGE ACQUISITION FOR DECISION SUPPORT SYSTEMS IN ELECTRONICS ASSEMBLY},
booktitle={Proceedings of the Fourth International Conference on Informatics in Control, Automation and Robotics - Volume 1: ICINCO},
year={2007},
pages={270-275},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0001615102700275},
isbn={978-972-8865-82-5},
issn={2184-2809},
}

TY - CONF

JO - Proceedings of the Fourth International Conference on Informatics in Control, Automation and Robotics - Volume 1: ICINCO
TI - DEFECT-RELATED KNOWLEDGE ACQUISITION FOR DECISION SUPPORT SYSTEMS IN ELECTRONICS ASSEMBLY
SN - 978-972-8865-82-5
IS - 2184-2809
AU - Gebus, S.
AU - Leiviskä, K.
PY - 2007
SP - 270
EP - 275
DO - 10.5220/0001615102700275
PB - SciTePress