A Dual-Formalism Approach to Checking Consistency of Class and State Diagrams in UML

W. L. Yeung

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Paper

A Dual-Formalism Approach to Checking Consistency of Class and State Diagrams in UML

In Proceedings of the 2nd International Workshop on Verification and Validation of Enterprise Information Systems - Volume 0ICEIS, 2-9, 2004 , Porto, Portugal

Author: W. L. Yeung

Affiliation: Lingnan University, Hong Kong

Abstract: The B Abstract Machine Notation (AMN) and the notation of Communicating Sequential Processes (CSP) have previously been applied to formalise the UML class and state diagrams, respectively. The paper discusses their integrated use in checking the consistency between the two UML diagrams based on some recent results of research in integrated formal methods. Through a small information system example, the paper illustrates a clear-cut separation of concerns in employing the two formal methods. Of particular interest is the treatment of recursive calls within a single class of objects.

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Paper citation in several formats:

L. Yeung, W. (2004). A Dual-Formalism Approach to Checking Consistency of Class and State Diagrams in UML. In Proceedings of the 2nd International Workshop on Verification and Validation of Enterprise Information Systems (ICEIS 2004) - VVEIS; ISBN 972-8865-03-1, SciTePress, pages 2-9. DOI: 10.5220/0002664300020009

@conference{vveis04,
author={W. {L. Yeung}.},
title={A Dual-Formalism Approach to Checking Consistency of Class and State Diagrams in UML},
booktitle={Proceedings of the 2nd International Workshop on Verification and Validation of Enterprise Information Systems (ICEIS 2004) - VVEIS},
year={2004},
pages={2-9},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0002664300020009},
isbn={972-8865-03-1},
}

TY - CONF

JO - Proceedings of the 2nd International Workshop on Verification and Validation of Enterprise Information Systems (ICEIS 2004) - VVEIS
TI - A Dual-Formalism Approach to Checking Consistency of Class and State Diagrams in UML
SN - 972-8865-03-1
AU - L. Yeung, W.
PY - 2004
SP - 2
EP - 9
DO - 10.5220/0002664300020009
PB - SciTePress