A Pitfall in Determining the Optimal Feature Subset Size

Juha Reunanen

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Paper

A Pitfall in Determining the Optimal Feature Subset Size

In Proceedings of the 4th International Workshop on Pattern Recognition in Information Systems - Volume 0ICEIS, 176-185, 2004 , Porto, Portugal

Author: Juha Reunanen

Affiliation: ABB, Web Imaging Systems, Finland

Keyword(s): Peaking phenomenon, feature selection, overfitting, accuracy estimation

Abstract: Feature selection researchers often encounter a peaking phenomenon: a feature subset can be found that is smaller but still enables building a more accurate classifier than the full set of all the candidate features. However, the present study shows that this peak may often be just an artifact due to the still too common mistake in pattern recognition — that of not using an independent test set.

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Paper citation in several formats:

Reunanen, J. (2004). A Pitfall in Determining the Optimal Feature Subset Size. In Proceedings of the 4th International Workshop on Pattern Recognition in Information Systems (ICEIS 2004) - PRIS; ISBN 972-8865-01-5, SciTePress, pages 176-185. DOI: 10.5220/0002650001760185

@conference{pris04,
author={Juha Reunanen.},
title={A Pitfall in Determining the Optimal Feature Subset Size},
booktitle={Proceedings of the 4th International Workshop on Pattern Recognition in Information Systems (ICEIS 2004) - PRIS},
year={2004},
pages={176-185},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0002650001760185},
isbn={972-8865-01-5},
}

TY - CONF

JO - Proceedings of the 4th International Workshop on Pattern Recognition in Information Systems (ICEIS 2004) - PRIS
TI - A Pitfall in Determining the Optimal Feature Subset Size
SN - 972-8865-01-5
AU - Reunanen, J.
PY - 2004
SP - 176
EP - 185
DO - 10.5220/0002650001760185
PB - SciTePress