loading
Papers

Research.Publish.Connect.

Paper

Paper Unlock

Authors: Cam-Ngan Tran and Michel Dao

Affiliation: France Télécom R&D DTL/TAL, France

ISBN: 972-8865-04-X

Abstract: In this article, we present a study of the correlation between factorization and the quality criterion of traceability. Our work is based on a set of new factorization metrics and a specific definition of traceability. The results of our experiment show a good correlation between the increase of the factorization of a UML class diagram and its traceability.

PDF ImageFull Text

Download
CC BY-NC-ND 4.0

Sign In Guest: Register as new SciTePress user now for free.

Sign In SciTePress user: please login.

PDF ImageMy Papers

You are not signed in, therefore limits apply to your IP address 3.234.214.113

In the current month:
Recent papers: 100 available of 100 total
2+ years older papers: 200 available of 200 total

Paper citation in several formats:
Tran C.; Dao M. and (2004). Traceability and Factorization in Class Diagrams: an Experimentation of their Correlation.In Proceedings of the 1st International Workshop on Software Audits and Metrics - Volume 1: SAM, (ICEIS 2004) ISBN 972-8865-04-X, pages 38-48. DOI: 10.5220/0002673500380048

@conference{sam04,
author={Cam{-}Ngan Tran and Michel Dao},
title={Traceability and Factorization in Class Diagrams: an Experimentation of their Correlation},
booktitle={Proceedings of the 1st International Workshop on Software Audits and Metrics - Volume 1: SAM, (ICEIS 2004)},
year={2004},
pages={38-48},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0002673500380048},
isbn={972-8865-04-X},
}

TY - CONF

JO - Proceedings of the 1st International Workshop on Software Audits and Metrics - Volume 1: SAM, (ICEIS 2004)
TI - Traceability and Factorization in Class Diagrams: an Experimentation of their Correlation
SN - 972-8865-04-X
AU - Tran, C.
AU - Dao, M.
PY - 2004
SP - 38
EP - 48
DO - 10.5220/0002673500380048

Login or register to post comments.

Comments on this Paper: Be the first to review this paper.