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Authors: Manuel S. Lazo-Cortés 1 ; José Fco. Martínez-Trinidad 2 ; J. Ariel Carrasco-Ochoa 2 ; Ventzeslav Valev 3 ; Mohammad Amin Shamshiri 4 and Adam Krzyżak 4

Affiliations: 1 TecNM/Instituto Tecnológico de Tlalnepantla, Edo. de Mexico 54070, Mexico ; 2 Instituto Nacional de Astrofísica, Óptica y Electrónica, Puebla 72840, Mexico ; 3 Institute of Mathematics and Informatics, Bulgarian Academy of Sciences, 1113 Sofia, Bulgaria ; 4 Department of Computer Science and Software Engineering, Concordia University, Montreal, H3G 1M8, Canada

Keyword(s): Non-reducible Descriptor, Typical Testor, Feature Selection.

Abstract: The concepts of non-reducible descriptor (NRD) and typical testor (TT) have been used for solving quite different pattern recognition problems, the former related to feature selection problems and the latter related to supervised classification. Both TT and NRD concepts are based on the idea of discriminating objects belonging to different classes. In this paper, we theoretically examine the connection between these two concepts. Then, as an example of the usefulness of our study, we present how the algorithms for computing typical testors can be used for computing non-reducible descriptors. We also discuss several future research directions motivated by this work.

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Paper citation in several formats:
Lazo-Cortés, M.; Martínez-Trinidad, J.; Carrasco-Ochoa, J.; Valev, V.; Shamshiri, M. and Krzyżak, A. (2022). Taking Advantage of Typical Testor Algorithms for Computing Non-reducible Descriptors. In Proceedings of the 11th International Conference on Pattern Recognition Applications and Methods - ICPRAM; ISBN 978-989-758-549-4; ISSN 2184-4313, SciTePress, pages 188-194. DOI: 10.5220/0010797300003122

@conference{icpram22,
author={Manuel S. Lazo{-}Cortés. and José Fco. Martínez{-}Trinidad. and J. Ariel Carrasco{-}Ochoa. and Ventzeslav Valev. and Mohammad Amin Shamshiri. and Adam Krzyżak.},
title={Taking Advantage of Typical Testor Algorithms for Computing Non-reducible Descriptors},
booktitle={Proceedings of the 11th International Conference on Pattern Recognition Applications and Methods - ICPRAM},
year={2022},
pages={188-194},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0010797300003122},
isbn={978-989-758-549-4},
issn={2184-4313},
}

TY - CONF

JO - Proceedings of the 11th International Conference on Pattern Recognition Applications and Methods - ICPRAM
TI - Taking Advantage of Typical Testor Algorithms for Computing Non-reducible Descriptors
SN - 978-989-758-549-4
IS - 2184-4313
AU - Lazo-Cortés, M.
AU - Martínez-Trinidad, J.
AU - Carrasco-Ochoa, J.
AU - Valev, V.
AU - Shamshiri, M.
AU - Krzyżak, A.
PY - 2022
SP - 188
EP - 194
DO - 10.5220/0010797300003122
PB - SciTePress