Authors:
Petr Tichavský
1
;
Miroslav Zima
1
and
Vladimir Krajča
2
Affiliations:
1
Institute of Information Theory and Automation and Czech Technical University in Prague, Czech Republic
;
2
Faculty Hospital Na Bulovce and Czech Technical University in Prague, Czech Republic
Keyword(s):
Artifact removal, Electroencephalogram, Independent component analysis, Second-order blind identification.
Related
Ontology
Subjects/Areas/Topics:
Applications and Services
;
Biomedical Engineering
;
Biomedical Signal Processing
;
Computer Vision, Visualization and Computer Graphics
;
Medical Image Detection, Acquisition, Analysis and Processing
Abstract:
In this paper we propose a method to identify and remove artifacts, that have a relatively short duration, from complex EEG data. The method is based on the application of an ICA algorithm to three non-overlapping partitions of a given data, selection of sparse independent components, removal of the component, and the combination of three resultant signal reconstructions in one final reconstruction. The method can be further enhanced by applying wavelet de-noising of the separated artifact components.