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Authors: Haijun Ji 1 ; Xiaofang Wang 1 ; Huiran Li 1 ; Zhiyuan Li 1 and Xinlu Cheng 2

Affiliations: 1 Equipment Support Department, Logistics University Of People's Armed Police Force, No.1, Huizhi Ring Road , Dongli District, Tianjin and China, China ; 2 Institute of Atomic and Molecular Physics, Sichuan University, No.24, South Part of First Ring Road , Wuhou District, Chengdu, China, Key Laboratory of High Energy Density Physics and Technology of Ministry of Education, Sichuan University, No.24, South Part of First Ring Road , Wuhou district, Chengdu and China, China

Keyword(s): Molecular dynamics simulation; The vacancy cluster; Amorphous silica

Abstract: In this paper, the influence of defect on the melting process of amorphous silica has been studied using molecular dynamics simulations. Using the bond evolution, it can be found that the melting process is intimately related to the formation of defect. Meanwhile, there are some differences in the melting process between the defected and undefected amorphous silica models. In addition, the pre-existing defect (void) contributes to the damage of SiO2 materials. And the glass transition temperature can be effectively reduced, when the defects meet certain concentration.

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Paper citation in several formats:
Ji, H.; Wang, X.; Li, H.; Li, Z. and Cheng, X. (2019). A Molecular Dynamics Simulation of the Influence of Defect on the Melting of Amorphous Silica. In The Second International Conference on Materials Chemistry and Environmental Protection - MEEP; ISBN 978-989-758-360-5, SciTePress, pages 193-198. DOI: 10.5220/0008187501930198

@conference{meep19,
author={Haijun Ji. and Xiaofang Wang. and Huiran Li. and Zhiyuan Li. and Xinlu Cheng.},
title={A Molecular Dynamics Simulation of the Influence of Defect on the Melting of Amorphous Silica},
booktitle={The Second International Conference on Materials Chemistry and Environmental Protection - MEEP},
year={2019},
pages={193-198},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0008187501930198},
isbn={978-989-758-360-5},
}

TY - CONF

JO - The Second International Conference on Materials Chemistry and Environmental Protection - MEEP
TI - A Molecular Dynamics Simulation of the Influence of Defect on the Melting of Amorphous Silica
SN - 978-989-758-360-5
AU - Ji, H.
AU - Wang, X.
AU - Li, H.
AU - Li, Z.
AU - Cheng, X.
PY - 2019
SP - 193
EP - 198
DO - 10.5220/0008187501930198
PB - SciTePress

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