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Author: Piotr Szczepaniak

Affiliation: Institute of Information Technology, Lodz University of Technology, Lodz and Poland

ISBN: 978-989-758-353-7

Keyword(s): Pattern Recognition, Native and Foreign Patterns, Classification, Active Contour, Quality of Data.

Related Ontology Subjects/Areas/Topics: Bioimaging ; Biomedical Engineering ; Feature Recognition and Extraction Methods ; Image Processing Methods

Abstract: This position paper presents an approach to the problem of foreign pattern rejection from a data set containing both native and foreign patterns. On the one hand, the approach may be regarded as classic in the sense that it is based on well-known concepts: class-contra-all-other classes or class-contra-class, but on the other hand, the novelty lies in the (embedding) application of potential active hypercontour, which is a powerful method for solving classification problems and may be applied as a binary or multiclass classifier.

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Paper citation in several formats:
Szczepaniak, P. (2019). Separation of Foreign Patterns from Native Ones: Active Contour based Mechanism.In Proceedings of the 12th International Joint Conference on Biomedical Engineering Systems and Technologies - Volume 2 BIOIMAGING: BIOIMAGING, ISBN 978-989-758-353-7, pages 150-154. DOI: 10.5220/0007579101500154

@conference{bioimaging19,
author={Piotr S. Szczepaniak.},
title={Separation of Foreign Patterns from Native Ones: Active Contour based Mechanism},
booktitle={Proceedings of the 12th International Joint Conference on Biomedical Engineering Systems and Technologies - Volume 2 BIOIMAGING: BIOIMAGING,},
year={2019},
pages={150-154},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0007579101500154},
isbn={978-989-758-353-7},
}

TY - CONF

JO - Proceedings of the 12th International Joint Conference on Biomedical Engineering Systems and Technologies - Volume 2 BIOIMAGING: BIOIMAGING,
TI - Separation of Foreign Patterns from Native Ones: Active Contour based Mechanism
SN - 978-989-758-353-7
AU - Szczepaniak, P.
PY - 2019
SP - 150
EP - 154
DO - 10.5220/0007579101500154

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