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Authors: Pedro A. Diaz-Gomez and Dean F. Hougen

Affiliation: Robotics, Evolution, Adaptation, and Learning Laboratory (REAL Lab), School of Computer Science, University of Oklahoma, United States

ISBN: 978-972-8865-89-4

Keyword(s): Misuse detection, genetic algorithms, iterative process, false negative, false positive.

Related Ontology Subjects/Areas/Topics: Artificial Intelligence and Decision Support Systems ; Enterprise Information Systems ; Evolutionary Programming

Abstract: With the explosion of the Internet and its use, the development of security mechanims are quite important in order to preserve the confidentiality, integrity, and availability of data stored in computers. However, the growth of intrusions can make such mechanisms almost unusable, in the sense that the computation time or space needed in order to mantain them can grow exponentially. This position paper presents an iterative process for doing misuse detection, and compares it with another approach for doing that: a Genetic Algorithm.

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Paper citation in several formats:
A. Diaz-Gomez P.; F. Hougen D. and (2007). MISUSE DETECTION - An Iterative Process vs. A Genetic Algorithm Approach.In Proceedings of the Ninth International Conference on Enterprise Information Systems - Volume 2: ICEIS, ISBN 978-972-8865-89-4, pages 455-458. DOI: 10.5220/0002410804550458

@conference{iceis07,
author={Pedro {A. Diaz{-}Gomez} and Dean {F. Hougen}},
title={MISUSE DETECTION - An Iterative Process vs. A Genetic Algorithm Approach},
booktitle={Proceedings of the Ninth International Conference on Enterprise Information Systems - Volume 2: ICEIS,},
year={2007},
pages={455-458},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0002410804550458},
isbn={978-972-8865-89-4},
}

TY - CONF

JO - Proceedings of the Ninth International Conference on Enterprise Information Systems - Volume 2: ICEIS,
TI - MISUSE DETECTION - An Iterative Process vs. A Genetic Algorithm Approach
SN - 978-972-8865-89-4
AU - A. Diaz-Gomez, P.
AU - F. Hougen, D.
PY - 2007
SP - 455
EP - 458
DO - 10.5220/0002410804550458

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