loading
Papers

Research.Publish.Connect.

Paper

Paper Unlock

Authors: Gintarė Vaidelienė and Jonas Valantinas

Affiliation: Kaunas University of Technology, Lithuania

ISBN: 978-989-758-175-5

Keyword(s): Texture Images, Defect Detection, Discrete Wavelets Transforms, Statistical Data Analysis, Automatic Visual Inspection.

Related Ontology Subjects/Areas/Topics: Color and Texture Analyses ; Computer Vision, Visualization and Computer Graphics ; Image and Video Analysis

Abstract: In this study, a new wavelet-based approach (system) to the detection of defects in grey-level texture images is presented. This new approach explores space localization properties of the discrete wavelet transform (DWT) and generates statistically-based parameterized defect detection criteria. The introduced system’s parameter provides the user with a possibility to control the percentage of both the actually defect-free images detected as defective and/or the actually defective images detected as defect-free, in the class of texture images under investigation. The developed defect detection system was implemented using discrete Haar and Le Gall wavelet transforms. For the experimental part, samples of ceramic tiles, as well as glass samples, taken from real factory environment, were used.

PDF ImageFull Text

Download
CC BY-NC-ND 4.0

Sign In Guest: Register as new SciTePress user now for free.

Sign In SciTePress user: please login.

PDF ImageMy Papers

You are not signed in, therefore limits apply to your IP address 100.26.176.182

In the current month:
Recent papers: 100 available of 100 total
2+ years older papers: 200 available of 200 total

Paper citation in several formats:
Vaidelienė, G. and Valantinas, J. (2016). Wavelet-based Defect Detection System for Grey-level Texture Images.In Proceedings of the 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 4 VISAPP: VISAPP, (VISIGRAPP 2016) ISBN 978-989-758-175-5, pages 143-149. DOI: 10.5220/0005678901430149

@conference{visapp16,
author={Gintarė Vaidelienė. and Jonas Valantinas.},
title={Wavelet-based Defect Detection System for Grey-level Texture Images},
booktitle={Proceedings of the 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 4 VISAPP: VISAPP, (VISIGRAPP 2016)},
year={2016},
pages={143-149},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0005678901430149},
isbn={978-989-758-175-5},
}

TY - CONF

JO - Proceedings of the 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 4 VISAPP: VISAPP, (VISIGRAPP 2016)
TI - Wavelet-based Defect Detection System for Grey-level Texture Images
SN - 978-989-758-175-5
AU - Vaidelienė, G.
AU - Valantinas, J.
PY - 2016
SP - 143
EP - 149
DO - 10.5220/0005678901430149

Login or register to post comments.

Comments on this Paper: Be the first to review this paper.