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Authors: Denis E. Trancă and George A. Stanciu

Affiliation: University Politehnica of Bucharest, Romania

Keyword(s): Near-field; optical microscopy; electric permittivity.

Abstract: New advances of the apertureless Scanning Near-field Optical Microscopy (a-SNOM) are presented in fields like materials science and biology. Together with experimental data, the oscillating point-dipole model (OPDM) is used for signal analysis, influence of functioning parameters analysis and for quantitative electric permittivity measurements with nanoscale resolution.

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Paper citation in several formats:
E. Trancă, D. and A. Stanciu, G. (2015). New Aproaches for High-Resolution Optical Microscopy.In Doctoral Consortium - DCPHOTOPTICS, (PHOTOPTICS 2015) ISBN , pages 19-25

@conference{dcphotoptics15,
author={Denis E. Trancă. and George A. Stanciu.},
title={New Aproaches for High-Resolution Optical Microscopy},
booktitle={Doctoral Consortium - DCPHOTOPTICS, (PHOTOPTICS 2015)},
year={2015},
pages={19-25},
publisher={SciTePress},
organization={INSTICC},
doi={},
isbn={},
}

TY - CONF

JO - Doctoral Consortium - DCPHOTOPTICS, (PHOTOPTICS 2015)
TI - New Aproaches for High-Resolution Optical Microscopy
SN -
AU - E. Trancă, D.
AU - A. Stanciu, G.
PY - 2015
SP - 19
EP - 25
DO -

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