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Author: Tatsuo Shiina

Affiliation: Chiba University, Japan

ISBN: 978-989-758-174-8

Keyword(s): OCT (Optical Coherence Tomography), Industry, Long Path, High Accuracy, Refractive Index, Group Index.

Abstract: Long-path optical coherence tomography was developed for industrial use. The system is compact and easy variable to change the measurement speed and range. In this study, its precision and long-path were designed as 1μm and 100mm, respectively. Refractive index of water was analysed by changing the temperature. The results well coincided with the theoretical curve of group index of refraction.

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Paper citation in several formats:
Shiina, T. (2016). Long Path Industrial OCT - High-precision Measurement and Refractive Index Estimation.In Proceedings of the 4th International Conference on Photonics, Optics and Laser Technology - Volume 1: OSENS, (PHOTOPTICS 2016) ISBN 978-989-758-174-8, pages 343-348. DOI: 10.5220/0005842903430348

@conference{osens16,
author={Tatsuo Shiina.},
title={Long Path Industrial OCT - High-precision Measurement and Refractive Index Estimation},
booktitle={Proceedings of the 4th International Conference on Photonics, Optics and Laser Technology - Volume 1: OSENS, (PHOTOPTICS 2016)},
year={2016},
pages={343-348},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0005842903430348},
isbn={978-989-758-174-8},
}

TY - CONF

JO - Proceedings of the 4th International Conference on Photonics, Optics and Laser Technology - Volume 1: OSENS, (PHOTOPTICS 2016)
TI - Long Path Industrial OCT - High-precision Measurement and Refractive Index Estimation
SN - 978-989-758-174-8
AU - Shiina, T.
PY - 2016
SP - 343
EP - 348
DO - 10.5220/0005842903430348

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