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Authors: Yutian Tang and Hareton Leung

Affiliation: The Hong Kong Polytechnic University, Hong Kong

ISBN: 978-989-758-097-0

Keyword(s): Variability, Feature Mining, Concept Location, Top-down Framework, Software Product Line.

Related Ontology Subjects/Areas/Topics: Enterprise Information Systems ; Information Systems Analysis and Specification ; Software Engineering ; Tools, Techniques and Methodologies for System Development

Abstract: Software product line engineering is regarded as a promising approach to generate tailored software products by referencing shared software artefacts. However, converting software legacy into a product line is extremely difficult, given the complexity, risk of the task and insufficient tool support. To cope with this, in this paper, we proposed a top-down feature-mining framework to facilitate developers extracting code fragments for features concerned. Our work aims to fulfill the following targets: (1) identify features at a fine granularity, (2) locate code fragments for concerned feature hierarchically and consistently, and (3) combine program analysis techniques and feature location strategies to improve mining performance. From our preliminary case studies, the top-down framework can effectively locate features and performs as good as Christians approach and performs better than the topology feature location approach.

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Paper citation in several formats:
Tang, Y. and Leung, H. (2015). Top-down Feature Mining Framework for Software Product Line.In Proceedings of the 17th International Conference on Enterprise Information Systems - Volume 1: ICEIS, ISBN 978-989-758-097-0, pages 71-81. DOI: 10.5220/0005370300710081

@conference{iceis15,
author={Yutian Tang. and Hareton Leung.},
title={Top-down Feature Mining Framework for Software Product Line},
booktitle={Proceedings of the 17th International Conference on Enterprise Information Systems - Volume 1: ICEIS,},
year={2015},
pages={71-81},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0005370300710081},
isbn={978-989-758-097-0},
}

TY - CONF

JO - Proceedings of the 17th International Conference on Enterprise Information Systems - Volume 1: ICEIS,
TI - Top-down Feature Mining Framework for Software Product Line
SN - 978-989-758-097-0
AU - Tang, Y.
AU - Leung, H.
PY - 2015
SP - 71
EP - 81
DO - 10.5220/0005370300710081

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