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Authors: Hongwei Wang 1 ; Jun Liu 2 ; Ziqiang Tao 1 ; Yanling Fu 1 ; Junfang Li 1 ; Haiqing Xiao 1 and Hong Bai 1

Affiliations: 1 Chinese Academy of Inspection and Quarantine, China ; 2 Beijing Petrochemical Engineering Co., Ltd, China

Keyword(s): Asbestos, Brake Pads, Scanning electron microscope, X-ray diffraction

Abstract: Asbestos is a proven carcinogen. It can able to exist in fibrous form, and be suspended in atmosphere and water for weeks or months, it constantly causing pollution on a large scale. Therefore, the technology of testing for asbestos in products is particularly important, receiving great attention. In this paper, the method of using a scanning electron microscope with a X-ray diffraction is used to identify the asbestos, and this method is simple, reliable and suitable to be widely applied.

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Paper citation in several formats:
Wang, H.; Liu, J.; Tao, Z.; Fu, Y.; Li, J.; Xiao, H. and Bai, H. (2020). Determination Method of Asbestos in Electrical and Electronic Products by using a Scanning Electron Microscope with a X-Ray Diffraction. In Proceedings of 5th International Conference on Vehicle, Mechanical and Electrical Engineering - ICVMEE; ISBN 978-989-758-412-1; ISSN 2184-741X, SciTePress, pages 265-269. DOI: 10.5220/0008365302650269

@conference{icvmee20,
author={Hongwei Wang. and Jun Liu. and Ziqiang Tao. and Yanling Fu. and Junfang Li. and Haiqing Xiao. and Hong Bai.},
title={Determination Method of Asbestos in Electrical and Electronic Products by using a Scanning Electron Microscope with a X-Ray Diffraction},
booktitle={Proceedings of 5th International Conference on Vehicle, Mechanical and Electrical Engineering - ICVMEE},
year={2020},
pages={265-269},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0008365302650269},
isbn={978-989-758-412-1},
issn={2184-741X},
}

TY - CONF

JO - Proceedings of 5th International Conference on Vehicle, Mechanical and Electrical Engineering - ICVMEE
TI - Determination Method of Asbestos in Electrical and Electronic Products by using a Scanning Electron Microscope with a X-Ray Diffraction
SN - 978-989-758-412-1
IS - 2184-741X
AU - Wang, H.
AU - Liu, J.
AU - Tao, Z.
AU - Fu, Y.
AU - Li, J.
AU - Xiao, H.
AU - Bai, H.
PY - 2020
SP - 265
EP - 269
DO - 10.5220/0008365302650269
PB - SciTePress

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