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Authors: Marjan Ilkov 1 ; Andreas Pedersen 2 ; Andrei Manolescu 1 and Ágúst Valfells 1

Affiliations: 1 Reykjavík University, Iceland ; 2 University of Iceland, Iceland

Keyword(s): Vacuum Microelectronics, Molecular Dynamics, Electron Beam, Space-charge Limited Flow, Terahertz.

Related Ontology Subjects/Areas/Topics: Application Domains ; Computer Simulation Techniques ; Electronics Design and Manufacturing ; Formal Methods ; Non-Linear Systems ; Simulation and Modeling ; Simulation Tools and Platforms

Abstract: Simulation of vacuum micro-diodes can be done quite effectively using molecular dynamics methods. This results in much higher fidelity simulations than can be obtained using the particle-in-cell method (PIC), which is most common for plasma and particle beam simulations. In particular, this method is superior to the PIC method when treating systems where collisional effects are important. In this paper we present some results concerning electron beam structure in a vacuum micro-diode obtained using a molecular dynamics code developed at Reykjavík University.

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Paper citation in several formats:
Ilkov, M.; Pedersen, A.; Manolescu, A. and Valfells, Á. (2013). Simulation of Self Organized Electron Beams in Vacuum Microdiodes. In Proceedings of the 3rd International Conference on Simulation and Modeling Methodologies, Technologies and Applications - SIMULTECH; ISBN 978-989-8565-69-3; ISSN 2184-2841, SciTePress, pages 224-228. DOI: 10.5220/0004595502240228

@conference{simultech13,
author={Marjan Ilkov. and Andreas Pedersen. and Andrei Manolescu. and Ágúst Valfells.},
title={Simulation of Self Organized Electron Beams in Vacuum Microdiodes},
booktitle={Proceedings of the 3rd International Conference on Simulation and Modeling Methodologies, Technologies and Applications - SIMULTECH},
year={2013},
pages={224-228},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0004595502240228},
isbn={978-989-8565-69-3},
issn={2184-2841},
}

TY - CONF

JO - Proceedings of the 3rd International Conference on Simulation and Modeling Methodologies, Technologies and Applications - SIMULTECH
TI - Simulation of Self Organized Electron Beams in Vacuum Microdiodes
SN - 978-989-8565-69-3
IS - 2184-2841
AU - Ilkov, M.
AU - Pedersen, A.
AU - Manolescu, A.
AU - Valfells, Á.
PY - 2013
SP - 224
EP - 228
DO - 10.5220/0004595502240228
PB - SciTePress

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