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Authors: C. Maria Keet 1 ; Mari Carmen Suárez-Figueroa 2 and María Poveda-Villalón 2

Affiliations: 1 University of KwaZulu-Natal, UKZN/CSIR-Meraka Centre for Artificial Intelligence Research and, South Africa ; 2 Universidad Politécnica de Madrid, Spain

ISBN: 978-989-8565-81-5

Keyword(s): Ontology Development, Ontology Quality, Pitfall.

Related Ontology Subjects/Areas/Topics: Artificial Intelligence ; Collaboration and e-Services ; Data Engineering ; e-Business ; Enterprise Information Systems ; Information Systems Analysis and Specification ; Knowledge Engineering and Ontology Development ; Knowledge-Based Systems ; Ontologies and the Semantic Web ; Ontology Engineering ; Semantic Web ; Soft Computing ; Symbolic Systems

Abstract: A growing number of ontologies are already available thanks to development initiatives in many different fields. In such ontology developments, developers must tackle a wide range of difficulties and handicaps, which can result in the appearance of anomalies in the resulting ontologies. Therefore, ontology evaluation plays a key role in ontology development projects. OOPS! is an on-line tool that automatically detects pitfalls, considered as potential errors or problems, and thus may help ontology developers to improve their ontologies. To gain insight in the existence of pitfalls and to assess whether there are differences among ontologies developed by novices, a random set of already scanned ontologies, and existing well-known ones, data of 406 OWL ontologies were analysed on OOPS!’s 21 pitfalls, of which 24 ontologies were also examined manually on the detected pitfalls. The various analyses performed show only minor differences between the three sets of ontologies, therewith provi ding a general landscape of pitfalls in ontologies. (More)

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Paper citation in several formats:
Keet, C.; Keet, C.; Suárez-Figueroa, M. and Poveda-Villalón, M. (2013). The Current Landscape of Pitfalls in Ontologies.In Proceedings of the International Conference on Knowledge Engineering and Ontology Development - Volume 1: KEOD, (IC3K 2013) ISBN 978-989-8565-81-5, pages 132-139. DOI: 10.5220/0004517901320139

@conference{keod13,
author={C. Maria Keet. and C. Maria Keet. and Mari Carmen Suárez{-}Figueroa. and María Poveda{-}Villalón.},
title={The Current Landscape of Pitfalls in Ontologies},
booktitle={Proceedings of the International Conference on Knowledge Engineering and Ontology Development - Volume 1: KEOD, (IC3K 2013)},
year={2013},
pages={132-139},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0004517901320139},
isbn={978-989-8565-81-5},
}

TY - CONF

JO - Proceedings of the International Conference on Knowledge Engineering and Ontology Development - Volume 1: KEOD, (IC3K 2013)
TI - The Current Landscape of Pitfalls in Ontologies
SN - 978-989-8565-81-5
AU - Keet, C.
AU - Keet, C.
AU - Suárez-Figueroa, M.
AU - Poveda-Villalón, M.
PY - 2013
SP - 132
EP - 139
DO - 10.5220/0004517901320139

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