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Authors: Sai Anirudh Karre and Y. Raghu Reddy

Affiliation: International Institute of Information Technology, India

ISBN: 978-989-758-100-7

Keyword(s): Defect Dependency, Defect Dataset, Dependency Metric, Software Quality, Integrated Software Products, Rule-based Classification.

Related Ontology Subjects/Areas/Topics: Service-Oriented Software Engineering and Management ; Software Engineering ; Software Quality Management

Abstract: Integrated software products are complex in design. They are prone to defects caused by integrated and non-integrated modules of the entire integrated software suite. In such software products, a small proportion of defects are fixed as soon as they are reported. Rest of the defects are targeted for fixes in future product release cycles. Among such targeted defects, most of them seem to be insignificant and innocuous in the current version but have the potential to become acute in future versions. In this paper, we propose an approach to study defect dependency of the reported defect using a dependency metric. Identifying the dependency of a defect in an integrated product suite can help the product stake-owners to prioritize them and help improve software quality.

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Paper citation in several formats:
Karre, S.; Karre, S.; Reddy, Y. and Reddy, Y. (2015). A Defect Dependency based Approach to Improve Software Quality in Integrated Software Products.In Proceedings of the 10th International Conference on Evaluation of Novel Approaches to Software Engineering - Volume 1: ENASE, ISBN 978-989-758-100-7, pages 110-117. DOI: 10.5220/0005368801100117

@conference{enase15,
author={Sai Anirudh Karre. and Sai Anirudh Karre. and Y. Raghu Reddy. and Y. Raghu Reddy.},
title={A Defect Dependency based Approach to Improve Software Quality in Integrated Software Products},
booktitle={Proceedings of the 10th International Conference on Evaluation of Novel Approaches to Software Engineering - Volume 1: ENASE,},
year={2015},
pages={110-117},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0005368801100117},
isbn={978-989-758-100-7},
}

TY - CONF

JO - Proceedings of the 10th International Conference on Evaluation of Novel Approaches to Software Engineering - Volume 1: ENASE,
TI - A Defect Dependency based Approach to Improve Software Quality in Integrated Software Products
SN - 978-989-758-100-7
AU - Karre, S.
AU - Karre, S.
AU - Reddy, Y.
AU - Reddy, Y.
PY - 2015
SP - 110
EP - 117
DO - 10.5220/0005368801100117

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