loading
Papers Papers/2022 Papers Papers/2022

Research.Publish.Connect.

Paper

Paper Unlock

Authors: Dipendra Jha 1 ; K. V. L. V. Narayanachari 2 ; Ruifeng Zhang 2 ; Denis T. Keane 3 ; Wei-keng Liao 1 ; Alok Choudhary 1 ; Yip-Wah Chung 2 ; Michael J. Bedzyk 2 and Ankit Agrawal 1

Affiliations: 1 Department of Electrical and Computer Engineering, Northwestern University, Evanston, IL, U.S.A. ; 2 Department of Materials Science and Engineering, Northwestern University, Evanston, IL, U.S.A. ; 3 DND-CAT Synchrotron Research Center, Northwestern University, Evanston, IL, U.S.A.

Keyword(s): X-ray Diffraction, Phase Clustering, Unsupervised Learning, Fuzzy C-means Clustering, Hierarchical Clustering, Composition-phase Diagram, Fuzzy Representation.

Abstract: X-ray diffraction (XRD) is a widely used experiment in materials science to understand the composition-structure-property relationships of materials for designing and discovering new materials. A key aspect of XRD analysis is that the composition-phase diagram is composed of not only pure phases but also their mixed phases. Hard clustering approach treats the mixed phases as separate independent clusters from their constituent pure phases, hence, resulting in incorrect phase diagrams which complicate the next steps. Here, we present a novel clustering approach of XRD patterns by leveraging a fuzzy clustering technique that can significantly enhance the potential phase mapping and reduce the manual efforts involved in XRD analysis. The proposed approach first generates an initial composition-phase diagram and initial pure phase representations by applying the fuzzy c-means clustering algorithm, followed by hierarchical clustering to accomplish effortless manual merging of similar init ial pure phases to generate the final composition-phase diagram. The proposed method is evaluated on the XRD samples from two high-throughput composition-spread experiments of Co-Ni-Ta and Co-Ti-Ta ternary alloy systems. Our results demonstrate significant improvement compared to hard clustering and almost completely eliminate manual efforts. (More)

CC BY-NC-ND 4.0

Sign In Guest: Register as new SciTePress user now for free.

Sign In SciTePress user: please login.

PDF ImageMy Papers

You are not signed in, therefore limits apply to your IP address 3.145.64.241

In the current month:
Recent papers: 100 available of 100 total
2+ years older papers: 200 available of 200 total

Paper citation in several formats:
Jha, D.; Narayanachari, K.; Zhang, R.; Keane, D.; Liao, W.; Choudhary, A.; Chung, Y.; Bedzyk, M. and Agrawal, A. (2021). Enhancing Phase Mapping for High-throughput X-ray Diffraction Experiments using Fuzzy Clustering. In Proceedings of the 10th International Conference on Pattern Recognition Applications and Methods - ICPRAM; ISBN 978-989-758-486-2; ISSN 2184-4313, SciTePress, pages 507-514. DOI: 10.5220/0010229905070514

@conference{icpram21,
author={Dipendra Jha. and K. V. L. V. Narayanachari. and Ruifeng Zhang. and Denis T. Keane. and Wei{-}keng Liao. and Alok Choudhary. and Yip{-}Wah Chung. and Michael J. Bedzyk. and Ankit Agrawal.},
title={Enhancing Phase Mapping for High-throughput X-ray Diffraction Experiments using Fuzzy Clustering},
booktitle={Proceedings of the 10th International Conference on Pattern Recognition Applications and Methods - ICPRAM},
year={2021},
pages={507-514},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0010229905070514},
isbn={978-989-758-486-2},
issn={2184-4313},
}

TY - CONF

JO - Proceedings of the 10th International Conference on Pattern Recognition Applications and Methods - ICPRAM
TI - Enhancing Phase Mapping for High-throughput X-ray Diffraction Experiments using Fuzzy Clustering
SN - 978-989-758-486-2
IS - 2184-4313
AU - Jha, D.
AU - Narayanachari, K.
AU - Zhang, R.
AU - Keane, D.
AU - Liao, W.
AU - Choudhary, A.
AU - Chung, Y.
AU - Bedzyk, M.
AU - Agrawal, A.
PY - 2021
SP - 507
EP - 514
DO - 10.5220/0010229905070514
PB - SciTePress