Authors:
Fayssal Boufelgha
1
;
N. Brihi
2
;
A. Bouaine
2
;
R. Zellagui
3
;
N. Ouafak
3
and
A. Boughelout
3
Affiliations:
1
Research Center in Industrial Technologies CRTI, P.O. Box 64, Cheraga 16014, Algeriers/ Thin Films Applications Unit-(UDCMA)- Setif- Algeria, Laboratoire de Physique de la Matière Condensée et Nanomatériaux (LPMCN), département de physique, Faculté des Sciences Exactes et Informatique, Université de Jijel, BP 98, OuledAissa, 18000 Jijel, Algeria., Algeria
;
2
Laboratoire de Physique de la Matière Condensée et Nanomatériaux (LPMCN), département de physique, Faculté des Sciences Exactes et Informatique, Université de Jijel, BP 98, OuledAissa, 18000 Jijel,, Algeria
;
3
Research Center in Industrial Technologies CRTI, P.O. Box 64, Cheraga 16014, Algeriers/ Thin Films Applications Unit-(UDCMA)- Setif- Algeria, Algeria
Keyword(s):
thin films, spin coater, ZnO / Al, XRD, SEM, UV-Visible.
Abstract:
In this work we studied the effect of aluminum doping concentration on the structural properties of zinc oxide thin films, we deposited samples of ZnO and aluminum doped ZnO with a doping rate of 1, 2, 3, 4 and 5%, on glass substrates by the spin coating technique. The structural characterization of the samples is done by the XRD and SEM techniques, the XRD spectra show that the layers are polycrystalline with a hexagonal würtzite structure, and a preferred orientation in the plane (002), and for the doping 5% the structure is almost monocrystaline (002). SEM images are used to confirm grain sizes and surface conditions. Optical characterization is done by UV-visible spectroscopy, gives a good visible transmittance up to 80% and exceeds 90% for 2% doping, and the gap varies with the doping variation with a small gap for the same doping (2%).