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Authors: Stephen M. Misak ; James A. Beil ; Rebecca B. Swertfeger and Paul O. Leisher

Affiliation: Rose-Hulman Institute of Technology, United States

ISBN: 978-989-758-223-3

Keyword(s): Beam Quality, Tapered Diode Laser, Broad-Area Diode Laser, Echelle Grating Spectrometer, Spectrally-Resolved Modes, Modal Power Distribution, Astigmatism.

Related Ontology Subjects/Areas/Topics: Lasers ; Optical Instrumentation ; Optics ; Photonics, Optics and Laser Technology ; Semiconductor Lasers and Leds

Abstract: Laser beam quality is an important factor for free-space communication and other high power applications. To achieve the power requirements for such applications, there is a trade-off with the M2 Beam Quality factor. While direct diode lasers offer higher efficiency in a smaller footprint compared to solid-state and fiber laser systems, beam quality is poor due to multi-mode operation. M2 measurements compliant with ISO 11146 standards require numerous measurements, especially for multimode lasers. It is possible to use faster, modal decomposition methods for measuring M2 by employing a spectrometer to spatially separate the modes of a laser. This work presents a custom Echelle Grating Spectrometer for spatially separating laser modes. This tool provides the basis for an alternative method of M2 measurements via Modal Power Distribution analysis.

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Paper citation in several formats:
Misak, S.; Beil, J.; Swertfeger, R. and Leisher, P. (2017). Investigating the Modal Dependencies of Beam Quality - Via Spectrally-resolved Imaging of the Mode Structure in Diode Lasers.In Proceedings of the 5th International Conference on Photonics, Optics and Laser Technology - Volume 1: PHOTOPTICS, ISBN 978-989-758-223-3, pages 245-251. DOI: 10.5220/0006152702450251

@conference{photoptics17,
author={Stephen M. Misak. and James A. Beil. and Rebecca B. Swertfeger. and Paul O. Leisher.},
title={Investigating the Modal Dependencies of Beam Quality - Via Spectrally-resolved Imaging of the Mode Structure in Diode Lasers},
booktitle={Proceedings of the 5th International Conference on Photonics, Optics and Laser Technology - Volume 1: PHOTOPTICS,},
year={2017},
pages={245-251},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0006152702450251},
isbn={978-989-758-223-3},
}

TY - CONF

JO - Proceedings of the 5th International Conference on Photonics, Optics and Laser Technology - Volume 1: PHOTOPTICS,
TI - Investigating the Modal Dependencies of Beam Quality - Via Spectrally-resolved Imaging of the Mode Structure in Diode Lasers
SN - 978-989-758-223-3
AU - Misak, S.
AU - Beil, J.
AU - Swertfeger, R.
AU - Leisher, P.
PY - 2017
SP - 245
EP - 251
DO - 10.5220/0006152702450251

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