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Authors: Jun-Bong Eom and Tae-Jin Lee

Affiliation: School of Information and Communication Engineerin, Sungkyunkwan University, Korea, Republic of

Keyword(s): Anti-collision algorithm, CRC-16, EPCglobal Class1 Generation2 protocol, RFID, RN16.

Related Ontology Subjects/Areas/Topics: Adaptive Wireless Network Protocols ; Telecommunications ; Wireless and Mobile Technologies ; Wireless Information Networks and Systems

Abstract: The 900 MHz UHF passive RFID systems have drawn attraction because they have long access distance and rapid identification speed. One of the most representative international standards is EPCglobal Class1 Generation2 (EPCglobal Gen2). RN16 which is used in the EPCglobal Gen2 standard assists a reader to detect tag collision rapidly, but it may be removed because it does not have information of products. In this paper, we propose an algorithm to replace RN16 with CRC-16 to reduce the identification time. We show that CRC-16 has similar characteristics of RN16 and our proposed scheme reduces the number of bits required for one tag identification.

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Paper citation in several formats:
Eom, J. and Lee, T. (2008). CRC-16-BASED COLLISION RESOLUTION IN EPCGLOBAL CLASS1 GENERATION2 RFID SYSTEMS. In Proceedings of the International Conference on Wireless Information Networks and Systems (ICETE 2008) - WINSYS; ISBN 978-989-8111-62-3, SciTePress, pages 61-65. DOI: 10.5220/0002021700610065

@conference{winsys08,
author={Jun{-}Bong Eom. and Tae{-}Jin Lee.},
title={CRC-16-BASED COLLISION RESOLUTION IN EPCGLOBAL CLASS1 GENERATION2 RFID SYSTEMS},
booktitle={Proceedings of the International Conference on Wireless Information Networks and Systems (ICETE 2008) - WINSYS},
year={2008},
pages={61-65},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0002021700610065},
isbn={978-989-8111-62-3},
}

TY - CONF

JO - Proceedings of the International Conference on Wireless Information Networks and Systems (ICETE 2008) - WINSYS
TI - CRC-16-BASED COLLISION RESOLUTION IN EPCGLOBAL CLASS1 GENERATION2 RFID SYSTEMS
SN - 978-989-8111-62-3
AU - Eom, J.
AU - Lee, T.
PY - 2008
SP - 61
EP - 65
DO - 10.5220/0002021700610065
PB - SciTePress

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