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Authors: Erdenetogtokh Jamsranjav 1 ; Tatsuo Shiina 1 ; Kenichi Kuge 1 ; Atsushi Ito 2 and Yasuhito Kinjo 3

Affiliations: 1 Chiba University, Japan ; 2 Tokai University, Japan ; 3 Tokyo Metropolitan Industrial Technology Research Institute, Japan

ISBN: 978-989-758-174-8

Keyword(s): Soft X-ray, Projection Microscopy, Iteration Procedure, Restraint Condition.

Related Ontology Subjects/Areas/Topics: Optics ; Photonics, Optics and Laser Technology ; Spectroscopy, Imaging and Metrology

Abstract: Soft X-ray projection microscopy has been developed for high magnified imaging of hydrated biological specimens because water window region is available. The projection microscopy is a simple optical layout and has advantages over other types of microscopes particularly for biological specimens because of its wide viewing area, easy zooming function and easy extension to CT. However the projection image is blurred by the diffraction of X-rays, resulting in the deterioration of the spatial resolution. In this study, the blurred images have been corrected by an iteration procedure, i.e., Fresnel and inverse Fresnel transformations are repeated. The correction was found to be not effective for every image, especially for images with low contrast. A contrast enhancement method prior to the iteration procedure was installed to make the iteration procedure more effective, but it was not enough yet due to the influence of background noise. We evaluated dependency between the background noise level and iteration effect in the cases with or without the contrast enhancement prior to the iteration procedure by simulation. We also demonstrated upper limits of the background noises which chromosome images are effectively corrected by the iteration procedure. (More)

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Paper citation in several formats:
Jamsranjav, E.; Shiina, T.; Kuge, K.; Ito, A. and Kinjo, Y. (2016). Noise Influence on Low Contrast Image Correction for Soft X-Ray Projection Microscopy.In Proceedings of the 4th International Conference on Photonics, Optics and Laser Technology - Volume 1: PHOTOPTICS, ISBN 978-989-758-174-8, pages 169-176. DOI: 10.5220/0005747001690176

@conference{photoptics16,
author={Erdenetogtokh Jamsranjav. and Tatsuo Shiina. and Kenichi Kuge. and Atsushi Ito. and Yasuhito Kinjo.},
title={Noise Influence on Low Contrast Image Correction for Soft X-Ray Projection Microscopy},
booktitle={Proceedings of the 4th International Conference on Photonics, Optics and Laser Technology - Volume 1: PHOTOPTICS,},
year={2016},
pages={169-176},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0005747001690176},
isbn={978-989-758-174-8},
}

TY - CONF

JO - Proceedings of the 4th International Conference on Photonics, Optics and Laser Technology - Volume 1: PHOTOPTICS,
TI - Noise Influence on Low Contrast Image Correction for Soft X-Ray Projection Microscopy
SN - 978-989-758-174-8
AU - Jamsranjav, E.
AU - Shiina, T.
AU - Kuge, K.
AU - Ito, A.
AU - Kinjo, Y.
PY - 2016
SP - 169
EP - 176
DO - 10.5220/0005747001690176

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