Reflective Surface Reconstruction from Inverse Deflectometric Measurements

Dominik Penk, Roman Sturm, Lars Seifert, Marc Stamminger, Günther Greiner

Abstract

Reconstructing reflective surfaces is a difficult task since most algorithms rely on photometric consistency between multiple views on the target object. However specular reflections are highly view dependent and thus violate this assumption. Previous work therefore often incorporates additional information, like polarization or the distortion of a known pattern, to perform specular surface reconstruction. We present a novel analysis by synthesis approach that defines an optimization problem using samples directly on the reconstructed surface. Based on this framework we describe two different setups for reconstruction, one using a line laser to create a reflection pattern and a second one, that uses point measurements to provide ray-measurement correspondences achieving improved accuracy.

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Paper Citation


in Harvard Style

Penk D., Sturm R., Seifert L., Stamminger M. and Greiner G. (2020). Reflective Surface Reconstruction from Inverse Deflectometric Measurements.In Proceedings of the 15th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 4: VISAPP, ISBN 978-989-758-402-2, pages 76-84. DOI: 10.5220/0008968600760084


in Bibtex Style

@conference{visapp20,
author={Dominik Penk and Roman Sturm and Lars Seifert and Marc Stamminger and Günther Greiner},
title={Reflective Surface Reconstruction from Inverse Deflectometric Measurements},
booktitle={Proceedings of the 15th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 4: VISAPP,},
year={2020},
pages={76-84},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0008968600760084},
isbn={978-989-758-402-2},
}


in EndNote Style

TY - CONF

JO - Proceedings of the 15th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 4: VISAPP,
TI - Reflective Surface Reconstruction from Inverse Deflectometric Measurements
SN - 978-989-758-402-2
AU - Penk D.
AU - Sturm R.
AU - Seifert L.
AU - Stamminger M.
AU - Greiner G.
PY - 2020
SP - 76
EP - 84
DO - 10.5220/0008968600760084