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Authors: Dominik Penk 1 ; Roman Sturm 2 ; Lars Seifert 3 ; Marc Stamminger 1 and Günther Greiner 1

Affiliations: 1 Visual Computing Lab, Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Cauerstraße 11, Erlangen, Germany ; 2 Rupp + Hubrach Optik GmbH, Von-Ketteler-Straße 1, Bamberg, Germany ; 3 Fraunhofer IIS, Flugplatzstraße 75, Fürth, Germany

Keyword(s): Reconstruction, Quality Control, Simulation, Numerical Optimization.

Abstract: Reconstructing reflective surfaces is a difficult task since most algorithms rely on photometric consistency between multiple views on the target object. However specular reflections are highly view dependent and thus violate this assumption. Previous work therefore often incorporates additional information, like polarization or the distortion of a known pattern, to perform specular surface reconstruction. We present a novel analysis by synthesis approach that defines an optimization problem using samples directly on the reconstructed surface. Based on this framework we describe two different setups for reconstruction, one using a line laser to create a reflection pattern and a second one, that uses point measurements to provide ray-measurement correspondences achieving improved accuracy.

CC BY-NC-ND 4.0

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Paper citation in several formats:
Penk, D.; Sturm, R.; Seifert, L.; Stamminger, M. and Greiner, G. (2020). Reflective Surface Reconstruction from Inverse Deflectometric Measurements. In Proceedings of the 15th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications (VISIGRAPP 2020) - Volume 4: VISAPP; ISBN 978-989-758-402-2; ISSN 2184-4321, SciTePress, pages 76-84. DOI: 10.5220/0008968600760084

@conference{visapp20,
author={Dominik Penk. and Roman Sturm. and Lars Seifert. and Marc Stamminger. and Günther Greiner.},
title={Reflective Surface Reconstruction from Inverse Deflectometric Measurements},
booktitle={Proceedings of the 15th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications (VISIGRAPP 2020) - Volume 4: VISAPP},
year={2020},
pages={76-84},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0008968600760084},
isbn={978-989-758-402-2},
issn={2184-4321},
}

TY - CONF

JO - Proceedings of the 15th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications (VISIGRAPP 2020) - Volume 4: VISAPP
TI - Reflective Surface Reconstruction from Inverse Deflectometric Measurements
SN - 978-989-758-402-2
IS - 2184-4321
AU - Penk, D.
AU - Sturm, R.
AU - Seifert, L.
AU - Stamminger, M.
AU - Greiner, G.
PY - 2020
SP - 76
EP - 84
DO - 10.5220/0008968600760084
PB - SciTePress

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