Authors:
            
                    Ariel Schwarz
                    
                        
                                1
                            
                    
                    ; 
                
                    Nisan Ozana
                    
                        
                                2
                            
                    
                    ; 
                
                    Amir Semer
                    
                        
                                1
                            
                    
                    ; 
                
                    Ran Califa
                    
                        
                                3
                            
                    
                    ; 
                
                    Hadar Genish
                    
                        
                                3
                            
                    
                     and
                
                    Zeev Zalevsky
                    
                        
                                2
                            
                    
                    
                
        
        
            Affiliations:
            
                    
                        
                                1
                            
                    
                    Faculty of Engineering and the Nanotechnology Center, Bar Ilan University, Webb 1, Ramat Gan, Israel, Department of Electrical Engineering, Jerusalem College of Engineering, Schreiboim 26, Jerusalem and Israel
                
                    ; 
                
                    
                        
                                2
                            
                    
                    Faculty of Engineering and the Nanotechnology Center, Bar Ilan University, Webb 1, Ramat Gan and Israel
                
                    ; 
                
                    
                        
                                3
                            
                    
                    ContinUse Biometrics Ltd., HaBarzel 32b, Tel Aviv and Israel
                
        
        
        
        
        
             Keyword(s):
            Lasers, Speckle Interferometry, Scattering, Rough Surfaces, Fourier Optics and Signal Processing.
        
        
            
                Related
                    Ontology
                    Subjects/Areas/Topics:
                
                        Biomedical Optics
                    ; 
                        Optics
                    ; 
                        Photonics, Optics and Laser Technology
                    
            
        
        
            
                Abstract: 
                In this paper, we describe a technique for elasticity and depth measurement via both secondary speckle and time multiplexing interference approach. Using external stimulation of elastic medium (in example: human tissue) by infra-sonic vibration, photons from different depths of the elastic medium were separated. In addition, this work uses a modulated laser that incorporates at the same scanning time, a speckle pattern tracking method for sensing surface tilting and interferometer method for sensing z-axis movements. In this paper, we present preliminary experiments showing the ability to separate data of light coming from different layers in the elastic medium.