Flow Index based Characterization of next Generation Sequencing Errors - Visualizing Pyrosequencing and Semiconductor Sequencing to Cope with Homopolymer Errors

Peter Sarkozy, Márton Enyedi, Peter Antal

2014

Abstract

We characterized the error sources of multiple resequencing measurements performed on the Ion Torrent Personal Genome Machines and the Roche 454 sequencing platforms. Homopolymer insertions and deletions are the most common error types for these platforms, and there are many underlying factors which define their occurrence patterns. In the paper we investigate the effect of flow order, specifically the difference in the average value of the flow values for each homopolymer run length, based on the position in the flow cycle.

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Paper Citation


in Harvard Style

Sarkozy P., Enyedi M. and Antal P. (2014). Flow Index based Characterization of next Generation Sequencing Errors - Visualizing Pyrosequencing and Semiconductor Sequencing to Cope with Homopolymer Errors . In Proceedings of the International Conference on Bioinformatics Models, Methods and Algorithms - Volume 1: BIOINFORMATICS, (BIOSTEC 2014) ISBN 978-989-758-012-3, pages 271-277. DOI: 10.5220/0004924902710277


in Bibtex Style

@conference{bioinformatics14,
author={Peter Sarkozy and Márton Enyedi and Peter Antal},
title={Flow Index based Characterization of next Generation Sequencing Errors - Visualizing Pyrosequencing and Semiconductor Sequencing to Cope with Homopolymer Errors},
booktitle={Proceedings of the International Conference on Bioinformatics Models, Methods and Algorithms - Volume 1: BIOINFORMATICS, (BIOSTEC 2014)},
year={2014},
pages={271-277},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0004924902710277},
isbn={978-989-758-012-3},
}


in EndNote Style

TY - CONF
JO - Proceedings of the International Conference on Bioinformatics Models, Methods and Algorithms - Volume 1: BIOINFORMATICS, (BIOSTEC 2014)
TI - Flow Index based Characterization of next Generation Sequencing Errors - Visualizing Pyrosequencing and Semiconductor Sequencing to Cope with Homopolymer Errors
SN - 978-989-758-012-3
AU - Sarkozy P.
AU - Enyedi M.
AU - Antal P.
PY - 2014
SP - 271
EP - 277
DO - 10.5220/0004924902710277