FLASH: A New Key Structure Extraction used for Line or Crack Detection

Yannick Faula, Yannick Faula, Yannick Faula, Yannick Faula, Stéphane Bres, Stéphane Bres, Stéphane Bres, Stéphane Bres, Véronique Eglin, Véronique Eglin, Véronique Eglin, Véronique Eglin

Abstract

Key structures extraction like points, short-lines or regions extraction is a big issue in computer vision. Many fields of application need large image acquisition and fast extraction of fine structures. Several methods have been proposed with different accuracies and execution times. In this study, we focus on situations where existing local feature extractors give not enough satisfying results concerning both accuracy and time processing. Especially, we focus on short-line extraction in local low-contrasted images. To this end, we propose a new Fast Local Analysis by threSHolding (FLASH) designed to process large images under hard time constraints. We apply FLASH on the field of concrete infrastructure monitoring where robots and UAVs(Unmanned Aerial Vehicles) are more and more used for automated defect detection (like cracks). For large concrete surfaces, there are several hard constraints such as the computational time and the reliability. Results show that the computations are faster than several existing algorithms without learning stage, and lead to an automated monitoring of infrastructures.

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Paper Citation


in Harvard Style

Faula Y., Bres S. and Eglin V. (2018). FLASH: A New Key Structure Extraction used for Line or Crack Detection.In Proceedings of the 13th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 4: VISAPP, ISBN 978-989-758-290-5, pages 446-452. DOI: 10.5220/0006656704460452


in Bibtex Style

@conference{visapp18,
author={Yannick Faula and Stéphane Bres and Véronique Eglin},
title={FLASH: A New Key Structure Extraction used for Line or Crack Detection},
booktitle={Proceedings of the 13th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 4: VISAPP,},
year={2018},
pages={446-452},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0006656704460452},
isbn={978-989-758-290-5},
}


in EndNote Style

TY - CONF

JO - Proceedings of the 13th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 4: VISAPP,
TI - FLASH: A New Key Structure Extraction used for Line or Crack Detection
SN - 978-989-758-290-5
AU - Faula Y.
AU - Bres S.
AU - Eglin V.
PY - 2018
SP - 446
EP - 452
DO - 10.5220/0006656704460452