Direct Observation of the 2D Gain Profile in High Power Tapered Semiconductor Optical Amplifiers

Rebecca B. Swertfeger, James A. Beil, Stephen M. Misak, Jeremy Thomas, Jenna Campbell, Daniel Renner, Milan Mashanovitch, Paul O. Leisher

Abstract

A novel experimental approach to permit direct observation of the 2D gain profile in high power tapered semiconductor optical amplifiers and integrated MOPA devices is reported. A two-dimensional simulation of the photon, carrier, and gain distributions inside the tapered amplifier demonstrate gain saturation effects that could be measured by directly viewing the spontaneous emission profile inside of the cavity. Tapered lasers with a built-in window on the back of the device are fabricated and a SWIR microscope camera is used to measure the spontaneous emission profile under operation at varying injection levels. The effect of gain saturation due to stimulated emission is clearly observed and in close agreement with the theoretical model.

References

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Paper Citation


in Harvard Style

Swertfeger R., Beil J., Misak S., Thomas J., Campbell J., Renner D., Mashanovitch M. and Leisher P. (2017). Direct Observation of the 2D Gain Profile in High Power Tapered Semiconductor Optical Amplifiers . In Proceedings of the 5th International Conference on Photonics, Optics and Laser Technology - Volume 1: PHOTOPTICS, ISBN 978-989-758-223-3, pages 114-121. DOI: 10.5220/0006187301140121


in Bibtex Style

@conference{photoptics17,
author={Rebecca B. Swertfeger and James A. Beil and Stephen M. Misak and Jeremy Thomas and Jenna Campbell and Daniel Renner and Milan Mashanovitch and Paul O. Leisher},
title={Direct Observation of the 2D Gain Profile in High Power Tapered Semiconductor Optical Amplifiers},
booktitle={Proceedings of the 5th International Conference on Photonics, Optics and Laser Technology - Volume 1: PHOTOPTICS,},
year={2017},
pages={114-121},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0006187301140121},
isbn={978-989-758-223-3},
}


in EndNote Style

TY - CONF
JO - Proceedings of the 5th International Conference on Photonics, Optics and Laser Technology - Volume 1: PHOTOPTICS,
TI - Direct Observation of the 2D Gain Profile in High Power Tapered Semiconductor Optical Amplifiers
SN - 978-989-758-223-3
AU - Swertfeger R.
AU - Beil J.
AU - Misak S.
AU - Thomas J.
AU - Campbell J.
AU - Renner D.
AU - Mashanovitch M.
AU - Leisher P.
PY - 2017
SP - 114
EP - 121
DO - 10.5220/0006187301140121