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Author: Gyung-bum Kim

Affiliation: Korea National University of Transportaion, Korea, Republic of

Keyword(s): Optical Scanning Mechanism, Solar Cell Wafer, Surface Inspection System, Near-infrared Optics.

Related Ontology Subjects/Areas/Topics: Detection and Estimation ; Digital Signal Processing ; Embedded Communications Systems ; Instrumentation and Measurement ; Location Systems and Technology ; Mobile and Pervasive Computing ; Sensors and Sensor Networks ; Telecommunications

Abstract: In this paper, an automatic vision system based on optical scanning mechanism is developed for solar cell wafer. It consists of optical scanning mechanism with near-infrared(NIR) camera optics, machinery and control system, algorithm of defect detection and software. Optical scanning mechanism is composed of geometrical camera optics and structured hybrid illumination system(SHIS). It is used to inspection of surface defects. Also, NIR camera optics is used for inspection of defects inside solar cell wafer. It is shown that the automatic inspection system give satisfactory performance for micro defects in solar cell wafer.

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Paper citation in several formats:
Kim, G. (2014). An Automatic Vision System using Optical Scanning Mechanism with Near-infrared Optics for Solar Cell Wafer. In Proceedings of the 4th International Conference on Pervasive and Embedded Computing and Communication Systems - PECCS; ISBN 978-989-758-000-0; ISSN 2184-2817, SciTePress, pages 27-30. DOI: 10.5220/0004679200270030

@conference{peccs14,
author={Gyung{-}bum Kim.},
title={An Automatic Vision System using Optical Scanning Mechanism with Near-infrared Optics for Solar Cell Wafer},
booktitle={Proceedings of the 4th International Conference on Pervasive and Embedded Computing and Communication Systems - PECCS},
year={2014},
pages={27-30},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0004679200270030},
isbn={978-989-758-000-0},
issn={2184-2817},
}

TY - CONF

JO - Proceedings of the 4th International Conference on Pervasive and Embedded Computing and Communication Systems - PECCS
TI - An Automatic Vision System using Optical Scanning Mechanism with Near-infrared Optics for Solar Cell Wafer
SN - 978-989-758-000-0
IS - 2184-2817
AU - Kim, G.
PY - 2014
SP - 27
EP - 30
DO - 10.5220/0004679200270030
PB - SciTePress