An Empirical Analysis of the Correlation between CK Metrics, Test Coverage and Mutation Score

Robinson Crusoé da Cruz, Marcelo Medeiros Eler

Abstract

: In this paper we investigate the correlation between test coverage, mutation score and object-oriented systems metrics. First we conducted a literature review to obtain an initial model of testability and existing object-oriented metrics related to testability. Thus we selected four open source system whose test cases were available and calculated the correlation between the metrics collected and the line coverage, branches coverage and mutation score. Preliminary results show that some CK metrics, which are strongly related to system’s design, influence mainly line coverage and mutation score, thus they can influence systems testability.

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Paper Citation


in Harvard Style

da Cruz R. and Medeiros Eler M. (2017). An Empirical Analysis of the Correlation between CK Metrics, Test Coverage and Mutation Score . In Proceedings of the 19th International Conference on Enterprise Information Systems - Volume 2: ICEIS, ISBN 978-989-758-248-6, pages 341-350. DOI: 10.5220/0006312703410350


in Bibtex Style

@conference{iceis17,
author={Robinson Crusoé da Cruz and Marcelo Medeiros Eler},
title={An Empirical Analysis of the Correlation between CK Metrics, Test Coverage and Mutation Score},
booktitle={Proceedings of the 19th International Conference on Enterprise Information Systems - Volume 2: ICEIS,},
year={2017},
pages={341-350},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0006312703410350},
isbn={978-989-758-248-6},
}


in EndNote Style

TY - CONF
JO - Proceedings of the 19th International Conference on Enterprise Information Systems - Volume 2: ICEIS,
TI - An Empirical Analysis of the Correlation between CK Metrics, Test Coverage and Mutation Score
SN - 978-989-758-248-6
AU - da Cruz R.
AU - Medeiros Eler M.
PY - 2017
SP - 341
EP - 350
DO - 10.5220/0006312703410350