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Authors: C. Shao ; H. Li and G. Xu

Affiliation: Chinese Academy of Sciences and The Chinese University of Hong Kong, China

ISBN: 978-989-758-167-0

Keyword(s): Fault Injection Attacks, DFST, Security Evaluation, Quantitative Evaluation, RSA.

Related Ontology Subjects/Areas/Topics: Computer-Supported Education ; Enterprise Information Systems ; Information Systems Analysis and Specification ; Information Technologies Supporting Learning ; Security ; Security and Privacy

Abstract: Fault injection attacks have become a serious threat against cryptographic ICs. However, the traditional security evaluation often demands experienced engineers repeatedly scan the IC under test for a few hours to a few days, and take the workload statistics and experiences as qualitative indexes. This paper proposes a quantitative model to evaluate security based Design for Security Test (DFST), considering both the sensitive time during the algorithm operation and the sensitive area of the cryptographic IC against fault injection attacks. The case study on two RSA implementations demonstrates the feasibility of the quantitative evaluation of security model.

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Paper citation in several formats:
Shao C., Li H. and Xu G. (2016). Quantitative Evaluation of Security on Cryptographic ICs against Fault Injection Attacks.In Proceedings of the 2nd International Conference on Information Systems Security and Privacy - Volume 1: ICISSP, ISBN 978-989-758-167-0, pages 97-104. DOI: 10.5220/0005686300970104

@conference{icissp16,
author={C. Shao and H. Li and G. Xu},
title={Quantitative Evaluation of Security on Cryptographic ICs against Fault Injection Attacks},
booktitle={Proceedings of the 2nd International Conference on Information Systems Security and Privacy - Volume 1: ICISSP,},
year={2016},
pages={97-104},
doi={10.5220/0005686300970104},
isbn={978-989-758-167-0},
}

TY - CONF

JO - Proceedings of the 2nd International Conference on Information Systems Security and Privacy - Volume 1: ICISSP,
TI - Quantitative Evaluation of Security on Cryptographic ICs against Fault Injection Attacks
SN - 978-989-758-167-0
AU - Shao C.
AU - Li H.
AU - Xu G.
PY - 2016
SP - 97
EP - 104
DO - 10.5220/0005686300970104

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