loading
Papers

Research.Publish.Connect.

Paper

Authors: Qiushi Cao 1 ; Cecilia Zanni-Merk 1 and Christoph Reich 2

Affiliations: 1 Normandie Université, INSA Rouen, LITIS, 76000 Saint- Étienne-du-Rouvray and France ; 2 Hochschule Furtwangen University, 78120 Furtwangen and Germany

ISBN: 978-989-758-330-8

Keyword(s): Industry 4.0, Condition Monitoring, Preventive Maintenance, Ontology, Intelligent System.

Abstract: In the manufacturing domain, machinery faults cause a company high costs. To avoid faulty conditions, the discipline of condition monitoring contributes significantly. The objective of condition monitoring is to determine the correctness of a machine, process or system. This is crucial for improving the productivity and availability of production systems. In most situations, when the tendency of a fault emerges, highly experienced and skilled professionals are capable of providing appropriate decisions about fault alarm launching and maintenance plans. However, production systems are becoming more complicated, and it is more likely that the professionals fail to respond to the faulty conditions timely and accurately. In this paper, we present an ontological framework, that is used for developing an intelligent system, which can provide decisions about alarm launching and maintenance plans in an intelligent and optimal manner. This framework is based on an ontological representation of condition monitoring knowledge in the manufacturing domain. The framework consists of an ontology structure which includes a core reference ontology for representing general condition monitoring concepts and relations, and several domain ontologies for formalizing manufacturing domain-specific knowledge. (More)

PDF ImageFull Text

Download
CC BY-NC-ND 4.0

Sign In Guest: Register as new SciTePress user now for free.

Sign In SciTePress user: please login.

PDF ImageMy Papers

You are not signed in, therefore limits apply to your IP address 18.210.22.132

In the current month:
Recent papers: 100 available of 100 total
2+ years older papers: 200 available of 200 total

Paper citation in several formats:
Cao, Q.; Zanni-Merk, C. and Reich, C. (2018). Towards an Ontological Representation of Condition Monitoring Knowledge in the Manufacturing Domain.In Proceedings of the 10th International Joint Conference on Knowledge Discovery, Knowledge Engineering and Knowledge Management - Volume 2: KEOD, ISBN 978-989-758-330-8, pages 312-318. DOI: 10.5220/0006957903120318

@conference{keod18,
author={Qiushi Cao. and Cecilia Zanni{-}Merk. and Christoph Reich.},
title={Towards an Ontological Representation of Condition Monitoring Knowledge in the Manufacturing Domain},
booktitle={Proceedings of the 10th International Joint Conference on Knowledge Discovery, Knowledge Engineering and Knowledge Management - Volume 2: KEOD,},
year={2018},
pages={312-318},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0006957903120318},
isbn={978-989-758-330-8},
}

TY - CONF

JO - Proceedings of the 10th International Joint Conference on Knowledge Discovery, Knowledge Engineering and Knowledge Management - Volume 2: KEOD,
TI - Towards an Ontological Representation of Condition Monitoring Knowledge in the Manufacturing Domain
SN - 978-989-758-330-8
AU - Cao, Q.
AU - Zanni-Merk, C.
AU - Reich, C.
PY - 2018
SP - 312
EP - 318
DO - 10.5220/0006957903120318

Login or register to post comments.

Comments on this Paper: Be the first to review this paper.