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Authors: Rebecca B. Swertfeger 1 ; James A. Beil 1 ; Stephen M. Misak 1 ; Jeremy Thomas 2 ; Jenna Campbell 2 ; Daniel Renner 2 ; Milan Mashanovitch 2 and Paul O. Leisher 3

Affiliations: 1 Rose-Hulman Institute of Technology, United States ; 2 Freedom Photonics and LLC., United States ; 3 Rose-Hulman Institute of Technology, Freedom Photonics and LLC., United States

ISBN: 978-989-758-223-3

Keyword(s): Semiconductor Laser, Diode Laser, Semiconductor Amplifier, Tapered Amplifier, Master-Oscillator Power-Amplifier (MOPA), High Power, Beam Quality, Single-Mode, Gain Profile, Longitudinal Spatial Hole Burning, Optical Communication Sources, Free-Space Optical Communication, InGaAsP, InP.

Related Ontology Subjects/Areas/Topics: High Intensity Lasers and High Field Phenomena ; Lasers ; Photodetectors, Sensors and Imaging ; Photonic and Optoelectronic Materials and Devices ; Photonics ; Photonics, Optics and Laser Technology ; Semiconductor Lasers and Leds

Abstract: A novel experimental approach to permit direct observation of the 2D gain profile in high power tapered semiconductor optical amplifiers and integrated MOPA devices is reported. A two-dimensional simulation of the photon, carrier, and gain distributions inside the tapered amplifier demonstrate gain saturation effects that could be measured by directly viewing the spontaneous emission profile inside of the cavity. Tapered lasers with a built-in window on the back of the device are fabricated and a SWIR microscope camera is used to measure the spontaneous emission profile under operation at varying injection levels. The effect of gain saturation due to stimulated emission is clearly observed and in close agreement with the theoretical model.

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Paper citation in several formats:
Swertfeger R., Beil J., Misak S., Thomas J., Campbell J., Renner D., Mashanovitch M. and Leisher P. (2017). Direct Observation of the 2D Gain Profile in High Power Tapered Semiconductor Optical Amplifiers.In Proceedings of the 5th International Conference on Photonics, Optics and Laser Technology - Volume 1: PHOTOPTICS, ISBN 978-989-758-223-3, pages 114-121. DOI: 10.5220/0006187301140121

@conference{photoptics17,
author={Rebecca B. Swertfeger and James A. Beil and Stephen M. Misak and Jeremy Thomas and Jenna Campbell and Daniel Renner and Milan Mashanovitch and Paul O. Leisher},
title={Direct Observation of the 2D Gain Profile in High Power Tapered Semiconductor Optical Amplifiers},
booktitle={Proceedings of the 5th International Conference on Photonics, Optics and Laser Technology - Volume 1: PHOTOPTICS,},
year={2017},
pages={114-121},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0006187301140121},
isbn={978-989-758-223-3},
}

TY - CONF

JO - Proceedings of the 5th International Conference on Photonics, Optics and Laser Technology - Volume 1: PHOTOPTICS,
TI - Direct Observation of the 2D Gain Profile in High Power Tapered Semiconductor Optical Amplifiers
SN - 978-989-758-223-3
AU - Swertfeger R.
AU - Beil J.
AU - Misak S.
AU - Thomas J.
AU - Campbell J.
AU - Renner D.
AU - Mashanovitch M.
AU - Leisher P.
PY - 2017
SP - 114
EP - 121
DO - 10.5220/0006187301140121

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